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        Medalist i1000D

        • 產(chǎn)品名稱:Medalist i1000D
        • 產(chǎn)品型號(hào):i1000D ict
        • 產(chǎn)品廠商:其它品牌
        • 產(chǎn)品文檔:
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        簡單介紹
        The Agilent Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards

        Medalist i1000D

        的詳細(xì)介紹

        The Agilent i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless./Medalist  i1000D

        With its new digital capabilities, the i1000D now can perform digital PCF/VCL library based testing, Boundary Scan and I2C/SPI serial programming on a simple, low-cost long-wired test fixture. This presents an excellent opportunity for customers who are looking for better test coverage without any increase in cost./Medalist  i1000D
        The i1000D retains all the cutting-edge innovations of the earlier models, such as Agilent VTEP v2.0 Powered vectorless test suite, comprising the award-winning iVTEP and Network Parameter Measurement, while adding the latest Cover-Extend Technology to its arsenal
        Ease of us                                                      

        ystem Highlights
         
         
         
        Digital test are usually viewed as
        complex, difficult to understand
        and debug by many users. With the
        i1000D, things are different. The
        digital debug GUI leverages the
        control and flexibility of the legendary
        i3070 PushButton debug GUI,
        allowing engineers and technicians
        to have full control of the digital test

         
         
         
         
         
        parameters and test source codes,
        yet making it easy to understand. This
        is achieved by transforming lines of
        the complicated digital test source
        codes into simple, easy to understand
        graphical waveforms. Engineers and
        technicians performing debug are
        shielded from the massive lines
        of codes.

         

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